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SIFT-MS: A New Tool for Impurity Profiling in Pharmaceutical Products

syft technologies webinar

DATE: 11 APRIL 2017 | TIME: 15:00 BST

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ABOUT THIS WEBINAR

SIFT-MS is a new tool for real-time, selective and economical trace gas and headspace analysis. SIFT-MS uses soft chemical ionisation to quantify volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharma applications, including:

  • Simple formaldehyde analysis
  • Residual solvent analysis
  • Packaging screening, including residual monomer analysis.

KEYNOTE SPEAKERS

Vaughan Langford, Director of Applications & Marketing, Syft Technologies

Vaughan completed his PhD in physical chemistry at the University of Canterbury in 1997 and joined Syft in 2002. He leads Syft Technologies’ applications and marketing departments. He will introduce the SIFT-MS analytical technique and its key benefits for the pharmaceutical industry.

Benefits he will outline include:

  • High throughput and continuous analysis of VOCs and inorganic gases
  • High sensitivity
  • Selective and comprehensive analysis
  • High immunity to moisture

Mark Perkins, Senior Applications Chemist, Anatune

Mark graduated from the University of Southampton with a PhD in electrochemistry. He was a senior analyst at the Malaysian Rubber Board’s UK research centre, before joining Anatune in 2015. He will introduce SIFT-MS applications that both simplify testing and improve productivity based on the rapid, direct analysis provided by SIFT-MS.

Applications he will introduce include:

  • Simple formaldehyde analysis
  • Residual solvent analysis
  • Packaging screening
  • Rapid analysis of volatile extractables and leachables

SUPPORTED BY:

One response to “SIFT-MS: A New Tool for Impurity Profiling in Pharmaceutical Products”

  1. Neyrinck says:

    we have to analyse VOC in breath, ideally short chain fatty acids, by SIFT-MS via a service and I don’t know this technique.

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